Leadframe with extended pad segments between leads and die pad, and leadframe package using the same

ABSTRACT

A leadframe package includes a die pad with four unitary, outwardly extending slender bars; a plurality of leads arranged along periphery of the die pad; a separate pad segment separated from the die pad and isolated from the plurality of leads; a semiconductor die mounted on an upper side of the die pad, wherein the semiconductor die contains first bond pads wire-bonded to respective the plurality of leads and a second bond pad wire-bonded to the separate pad segment; and a molding compound encapsulating the semiconductor die, the upper side of the die pad, the first suspended pad segment and inner portions of the plurality of leads.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation-in-part of U.S. application Ser. No. 11/964,054 filed Dec. 26, 2007. This application also claims the benefit of U.S. provisional application No. 60/871,993 filed Dec. 27, 2006.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a leadframe used for semiconductor devices and more particularly, to a leadframe package with multiple exposed pads and method for fabricating the same.

2. Description of the Prior Art

Semiconductor dies are conventionally enclosed in plastic packages that provide protection from hostile environments and enable electrical interconnection between the semiconductor die and a substrate such as a printed circuit board (PCB). Such an integrated circuit (IC) package includes a metal leadframe, a semiconductor die mounted on a unitary die pad of the leadframe, and bond wires electrically connecting bond pads on the semiconductor die to individual leads of the leadframe. The leadframe and the semiconductor die are eventually encapsulated in a molding compound.

The technology trends in the back-end packaging industry can be summarized as “more functionality in a smaller space”. The functionality of the integrated circuit chips is becoming more and more complicated, leading to increased number of external connection pins of the leadframe package. As the pin count is increased, the cost of packaging each die is increased accordingly. To avoid an undesirable increase in the size of the package attributable to the increased number of connection pins or leads, one approach is reducing the lead pitch. However, narrowing the lead pitch results in increase in the level of mutual inductance and mutual capacitance generated from the leads of the package. Thus, leadframe packages are typically considered to be unsuitable for high-speed semiconductor dies, which transmit signals at high speeds, since the relatively high inductance and capacitance may distort the transmitted signals.

In this regard, many mobile communication devices (e.g., cellular phones) and personal communication devices which are equipped with semiconductor dies capable of transmitting high-frequency signals typically are outfitted with BGA (ball grid array) packages which accommodate such semiconductor dies. If such semiconductor dies were to be installed or packaged in a leadframe package, significant signal loss or noise such as AC noise becomes a problem.

However, the drawback of the BGA package is that it is relatively more expensive than the leadframe package, and the product turn-around-time (TAT) of the BGA package is longer. Besides, one challenge of developing radio-frequency system-on-a-chip (RF-SoC) is the difficulty in lowering power consumption of RF and analogy circuits and reducing the size of passive components and analog transistors.

Therefore, there is a strong need in this industry to provide an improved leadframe structure and leadframe package, which are cost-effective and are particularly suited for high-speed semiconductor dies and are capable of alleviating signal loss or noise when transmitting high-frequency signals.

SUMMARY OF THE INVENTION

A first preferred embodiment is a method for packaging a semiconductor device. The method includes the following steps: mounting the semiconductor device on a primary portion of a die pad of a leadframe, the die pad further comprising at least one secondary portion and at least one separating portion, the primary portion and the secondary portion being connected via the separating portion; wiring a set of signal lines from the semiconductor device to leads of leadframe; encapsulating the semiconductor device and the leadframe with a molding compound wherein the bottom side of the die pad is exposed outside the molding compound; and applying a separating etching, drilling or carving on the separating portion so as electrically disconnect the primary portion and the secondary portion.

A secondary preferred embodiment is a method for manufacturing a leadframe used for packaging a semiconductor device. The method includes: patterning a leadframe on a metal plate; manufacturing a preliminary leadframe; defining a primary portion, at least one secondary portion and at least one separating portion on the preliminary leadframe with mask; and performing a preliminary etching the separating portion so that the thickness of the separating portion is smaller than the thicknesses of the primary portion and the secondary portion.

A third preferred embodiment is a semiconductor package product. The semiconductor package product includes: a semiconductor device; a die pad having a primary portion and at least one secondary portion, the primary portion carrying the semiconductor device; multiple leads for connecting a set of signal lines wired to the semiconductor device; and a molding compound for encapsulating the semiconductor device, the die pad and a portion of the leads and for exposing a bottom side of the primary and secondary portions, wherein there are more than two signal lines of a secondary set of signal lines wired from the semiconductor device to the secondary portion and the secondary set of signal lines are electrically connected to a signal terminal of a circuit board via the exposed bottom side.

Another embodiment is a leadframe package including a die pad; a semiconductor die attached to the die pad; a plurality of leads disposed along four peripheral edges of the die pad; a first exposed pad segment disposed between the plurality of leads and the die pad; a second exposed pad segment being spaced apart from the first exposed pad segment and being disposed between the first exposed pad segment and the die pad; conductive wires electrically connected to and extending between the semiconductor die and respective ones of the leads, the first exposed pad segment and the second exposed pad segment; and a molding compound at least partially encapsulating the die pad, the leads, the first exposed pad segment, the second exposed pad segment and the conductive wires, wherein bottom surfaces of the die pad, the first exposed pad segment and the second exposed pad segment are exposed within the molding compound.

Still another embodiment is a leadframe including a die pad for mounting a semiconductor die thereon; a plurality of leads disposed along four peripheral edges of the die pad; a first pad segment disposed between the plurality of leads and the die pad, wherein the first pad segment juts out from one of the four peripheral edges of the die pad; and a second pad segment being spaced apart from the first exposed pad segment and being disposed between the first exposed pad segment and the die pad.

With these embodiments, e.g. improved leadframe and its manufacturing process, semiconductor package produces have more spare leads to be used, less noise interference and better electronic signal quality.

These and other objectives of the present invention will no doubt become obvious to those of ordinary skill in the art after reading the following detailed description of the preferred embodiment that is illustrated in the various figures and drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention. In the drawings:

FIG. 1 illustrates a perspective top view of a typical leadframe package;

FIG. 2 is a schematic diagram illustrating a perspective top view of a leadframe package according to one preferred embodiment of this invention;

FIG. 3 is a schematic, cross-sectional diagram illustrating the leadframe package according to this invention;

FIG. 4 is an enlarged, schematic diagram illustrating a cross-sectional view of the separate pad segment and the slit encircling the separate pad segment according to this invention;

FIG. 5 illustrates a variant of the slit according to this invention;

FIG. 6 illustrates another variant of the slit according to this invention;

FIG. 7 illustrating the die pad and exemplary inductive segments thereon according to this invention;

FIG. 8 depicts a flow chart demonstrating the manufacturing process of the leadframe having multiple die pads according to this invention;

FIG. 9 to FIG. 13 are schematic, cross-sectional diagrams illustrating the intermediate steps during the fabrication of a leadframe package using two-stage etching method according this invention;

FIG. 14 to FIG. 17 are schematic, cross-sectional diagrams illustrating the intermediate steps during the fabrication of a leadframe package having the reverse T-shaped slit as set forth in FIG. 4;

FIG. 18 illustrates a top view of a SiP leadframe package according to another preferred embodiment of this invention;

FIGS. 19 and 20 demonstrate a flip-chip leadframe package in accordance with still another preferred embodiment of this invention;

FIG. 21 is a schematic, cross-sectional diagram showing a leadframe package according to this invention;

FIG. 22 illustrates an exemplary layout of the leadframe according to this invention;

FIGS. 23-25 are enlarged top views showing portions of the leadframe of FIG. 22;

FIG. 26 illustrates the bond pads, the pad segments M30˜M32 and the conductive wires according to this invention; and

FIG. 27 shows anther exemplary pad segment layout according to this invention.

DETAILED DESCRIPTION

The improved leadframe package structure, as described below, is suited for the applications including, but not limited to, LQFP (Low-Profile Quad Flat Pack) packaging, TQFP (Thin Quad Flat Pack) packaging, QFN (Quad Flat Non-leaded) packaging, DFN (Dual Flat No-lead) packaging, multi-zone QFN, and multi-die flip-chip packaging.

The present invention is capable of pushing the limits of conventional leadframe package by sparing or releasing a number of the leads that used to be wire bonded to ground pads, power pads or some signal pads on a packaged semiconductor die. Besides, the present invention is capable of improving electrical performance of the integrated circuit package by utilizing separate grounding systems on the die pad.

FIG. 1 illustrates a perspective top view of a leadframe package 10. As shown in FIG. 1, the leadframe package 10 includes a semiconductor die 12, an example of a semiconductor device that is mounted on a die pad 14. A plurality of bond pads 13 are provided on a top surface of the semiconductor die 12. Each of the plurality of bond pads 13 is electrically connected to a corresponding lead 16 through a bond wire 18.

The bond pads 13, which are also known as input/output pads or I/O pads, generally comprises power pads 13 a˜13 f, ground pads 13 g and 13 h, and signal pads, etc. The power pads 13 a˜13 f are bonded to respective leads 16 a˜16 f through the bond wires 18, which are signal lines. The ground pads 13 g and 13 h are bonded to the die pad 14 through the bond wires 26.

The leads 16, which are eventually mounted onto a socket of a printed circuit board (PCB), are disposed along four sides of the die pad 14. The semiconductor die 12, the die pad 14, inner ends of the leads 16 and the bond wires 18 are encapsulated in a molding compound 20.

In this example, the die pad 14 is a unitary, rectangular-shaped planar area with four slender supporting bars 15 extending outward from four corners of the die pad 14. But, please note that other shapes of die pad, e.g. a die pad without four slender supporting bars, may also be applied with the invention. A bottom side (not shown) of the die pad 14 is deliberately exposed in the package body to dissipate heat generated by the semiconductor die 12, which is known as Exposed die pad (abbr. E-pad) configuration. Typically, the exposed bottom side of the die pad 14 is electrically connected to a ground layer of the PCB.

However, it is disadvantageous in some SoC applications where the semiconductor die 12 has analog/digital mixed circuits and is capable of transmits high-frequency signals because the digital ground noise may adversely affect the analog signal path.

Please refer to FIG. 2 and FIG. 3. FIG. 2 is a schematic diagram illustrating a perspective top view of a leadframe package 10 a according to one preferred embodiment of this invention. FIG. 3 is a schematic, cross-sectional diagram illustrating the leadframe package 10 a, wherein like numerals designate like components, regions or layers.

As shown in FIG. 2 and FIG. 3, the leadframe package 10 a comprises a semiconductor die 12 that is mounted on a die pad 14 of copper or copper alloys such as C7025, A192 or the like. Likewise, a plurality of bond pads 13 are provided on a top surface of the semiconductor die 12. Some of the bond pads 13 are electrically connected to corresponding leads 16 through bond wires 18.

The bond pads 13 comprises power pads 13 a˜13 f, digital ground pads 13 g and 13 h, analog ground pads 13 i and 13 j, and signal pads, etc. One distinct feature of the present invention is that the power pads 13 a˜13 f are bonded to a separate pad segment 14 a through shorter bond wires 28 instead of bonding to leads 16 a˜16 f. By doing this, the leads 16 a˜16 f, which are originally boned to respective power pads 13 a˜13 f, can be spared for other uses, for example, connecting to other signal pads on the semiconductor die 12, or they can be just omitted to reduce the lead numbers and thus the size and cost of the leadframe package 10 a.

From one aspect, the performance of the leadframe package 10 a can be improved by omitting leads 16 a˜16 f, which were used to be connected to power pads 13 a˜13 f on the semiconductor die 12. This is because the lead pitch is increased and also because the signal-transmitting path between the die and PCB becomes shorter.

Another distinct feature of the present invention is that the separate pad segment 14 a, which is partitioned off from the die pad 14, does not directly contact with the die pad 14 and is completely isolated from the die pad 14. In addition, the separate pad segment 14 a does not directly contact with or supported by any of the leads 16. Therefore, the separate pad segment 14 a does not consume any of the leads 16. Similar to the die pad 14, the bottom side of the separate pad segment 14 a is also exposed in the package body such that the separate pad segment 14 a can be electrically connected to a power layer of the PCB for providing power signals to the semiconductor die 12.

An additional feature of the present invention is that the digital ground pads 13 g and 13 h on the semiconductor die 12 are bonded to the die pad 14 through the bond wires 26, and the analog ground pads 13 i and 13 j on the semiconductor die 12 are bonded to a separate pad segment 14 b through the bond wires 36.

According to this invention, the die pad 14 is connected to a digital ground signal while the separate pad segment 14 b is connected to an analog ground signal. Such separate grounding systems on die pad prevent digital circuit noise from affecting the analog signal path. Besides, the analog ground pads 13 i and 13 j are grounded and wire bonded to the separate pad segment 14 b, which means shorter signal-transmitting path than a path through the leads 16.

Likewise, the separate pad segment 14 b, which is partitioned off from the die pad 14, does not directly contact with the die pad 14 and is completely isolated from the die pad 14.

As shown in FIG. 3, similar to the separate pad segment 14 a, the separate pad segment 14 b does not directly contact with any of the leads 16. More specifically, the separate pad segment 14 b does not need any structural support from the leads 16 or the die pad 14. The slit 40 a between the separate pad segment 14 a and the die pad 14 and the slit 40 b between the separate pad segment 14 b and the die pad 14 are both filled with epoxy molding compound 20.

Please note that on the die pad 14, there are three types of portions, i.e. a primary portion, at least one secondary portion and at least one separating portion that separate the primary portion and the secondary portion. In FIG. 2, the separate pad segments 14 a and 14 b are examples of the secondary portion. The slits 40 a and 40 b are used as separating portions for separating the secondary portions like the separated pad segments 14 a and 14 b from a primary portion of the die pad 14.

The bottom side of the separate pad segment 14 b is exposed in the package body such that the separate pad segment 14 b can be electrically connected to an analog ground (AGND) layer of the PCB. The exposed bottom side of the die pad 14 is connected to a digital ground (DGND) layer. As previously mentioned, such separate grounding systems on die pad prevent digital circuit noise from affecting the analog signal path.

FIG. 4 is an enlarged, schematic diagram illustrating a cross-sectional view of the separate pad segment 14 a and the slit 40 b encircling the separate pad segment 14 b according to this invention. As shown in FIG. 4, a layer of plated noble metal 52 a, such as gold, silver, palladium, platinum, iridium, rhenium, ruthenium, osmium, nickel silver, nickel gold or combinations thereof, is disposed on the molded upper side (die side) of the die pad 14 and the separate pad segment 14 b. The exposed bottom sides (PCB side) of the die pad 14 and the separate pad segment 14 a are both coated by a layer of noble metal 52 b. A passive component 60 may be mounted between the pads 14 and 14 b across the slit 40 b for decoupling, ESD (electrostatic discharge) or other specific circuit (e.g., filter or matching) designs purposes.

It is another feature of this embodiment that the slit 40 b (or slit 40 a) has a reverse T-shaped cross-section. The epoxy molding compound 20 fills the reverse T-shaped slit 40 b, which meliorates the reliability and deformation of the leadframe body. Due to the reverse T-shaped slit 40 b, the injected molding compound 20 can tightly hold the suspended separate pad segment 14 b in place.

FIG. 5 illustrates a variant of the slit 40 b (or 40 a). As shown in FIG. 5, the sandglass-shaped slit 40 b has a ladder-shaped upper portion on the molded upper side or die side. FIG. 6 illustrates another variant of the slit 40 b (or 40 a). As shown in FIG. 6, the separate pad segment 14 b has saw-tooth-like edges 70. This enhances the adhesion between the separate pad segment 14 b and the molding compound 20 that fills into the slit 40 b.

FIG. 7 illustrates the die pad 14 and exemplary inductive segments 82 and 84 thereon according to this invention. The serpentine inductive segment 82 and spiral-shaped inductive segment 84, which can be used to form on-pad inductors, are integrally formed with the die pad of the leadframe. The serpentine inductive segment 82 and spiral-shaped inductive segment 84 do not directly contact with the die pad 14. More specifically, the inductive segments 82 and 84 do not need any structural support from the leads 16 or the die pad 14.

Epoxy molding compound is filled into the slit 82 a between the serpentine inductive segment 82 and the die pad 14 and into the slit 84 a between the spiral-shaped inductive segment 84 and the die pad 14. The slits 82 a and 84 a may have reverse T-shaped cross-section as set forth in FIG. 4.

Since the inductive segments 82 and 84 are not connected to any of the leads 16, the inductor thereof has high quality Q factor, reduced parasitic capacitance and lower resonance frequency.

FIG. 8 depicts a flow chart demonstrating the manufacturing process of the leadframe package having multiple exposed pads according to this invention. From one aspect, the present invention leadframe package may be fabricated using two-stage etching method. That is, the die pad is first half-etched (the step indicated by numeral number 102), also called “preliminary etching”, during the first stage 100 by a leadframe manufacturing company and second half-etched (the step indicated by numeral number 202), also called “separating etching” during a second stage 200 by a subsequent assembly house after package molding is completed. The conventional leadframe package assembly process can be used except “Back-side Mark”, “Removal of Back-side Mark”, and “Etching” after “Molding” as shown in FIG. 8. “Back-side Mark” is to print with the artwork or photoresist on the connecting bars of the bottom metal for the purpose of plating (Sn) resistant. After the package is plated with tin (Sn) or noble metal except the connecting bars, the molded package with exposed leadframe is protected and resistant to corrosion. Then, the artwork or photoresist on the bottom side of connecting bars is removed. The connecting bars are etched away in the photochemical machine and each exposed pad is electrically isolated. The second half-etching partitions off and separates the pad segments 14 a and 14 b from the main die pad 14. Alternatively, the connecting bars can be drilled or carved away using the drilling machine or the PCB carving machine.

Please refer to FIG. 9 to FIG. 13, and briefly back to FIG. 8. FIG. 9 to FIG. 13 are schematic, cross-sectional diagrams illustrating the intermediate steps during the fabrication of a leadframe package using two-stage etching method according this invention. It is noted that the components or layers are not drawn to scale for the sake of clarity. As shown in FIG. 9, after etching (or stamping) and plating, a leadframe 300 is provided. The leadframe 300 comprises a unitary die pad 314 and peripheral leads 316. The both sides of the die pad 314 are coated with an etching mask 322 such as noble metals, metal alloys or photoresist. The etching mask 322 has slit openings 324, which define an isolated pad pattern 350 to be transferred into the underlying die pad 314.

As shown in FIG. 10, a first half etching process is carried out on the die side to etch away a predetermined thickness of the die pad 314 through the slit openings of the etching mask 322. As previously mentioned, this first half etching process can be accomplished in a leadframe manufacturing company. The half-etched leadframe 300 is then shipped to an assembly house.

As shown in FIG. 11, in an assembly house, a semiconductor die 312 is attached onto the die pad 314. Bond wires 318 and 336 are provided to form electrically connection between the bond pads 313 and the leads 316 and between the bond pads 313 on the semiconductor die 312 and the die pad 314.

As shown in FIG. 12, after wire bonding, the entire assembly as depicted in FIG. 11 is molded using a thermosetting compound 320. This compound may be a low-temperature hardening resin. Subsequently, the molded package may be subjected to a curing process. As specifically indicated, the bottom side or PCB side of the molded package is exposed.

As shown in FIG. 13, after molding, the exposed PCB side of the molded package is subjected to a second half etching process to etch the remanent thickness of the die pad 314 through the corresponding slit openings 324 of the etching mask 322, thereby forming a separate pad segment 314 a that is partitioned off from the die pad 314. The partitioned pad segment 314 a is completely isolated from the die pad 314 and does not directly contact with the die pad 314. The secondary etching may also be replaced by a carving processing with a carving machine, which is available on carving patterns on printed circuit boards.

FIG. 14 to FIG. 17 are schematic, cross-sectional diagrams illustrating the intermediate steps during the fabrication of a leadframe package having reverse T-shaped slit as set forth in FIG. 4 according another aspect of this invention. As shown in FIG. 14, after etching (or stamping) and plating, a leadframe 300 is provided. The leadframe 300 comprises a unitary die pad 314 and peripheral leads 316. The both sides of the die pad 314 are coated with an etching mask 322 On the exposed bottom side, the etching mask 322 includes supporting bar pattern (not shown) for provisionally connecting between the pad segment 314 a and die pad 314. The etching mask 322 may be made of noble metals, metal alloys or photoresist. The etching mask 322 has slit openings 324, which define a separate pad pattern 350 to be transferred into the underlying die pad 314.

Subsequently, as shown in FIG. 15, a first etching process (including half etching from the die side and the other half etching from the bottom side of the die pad 314) is carried out on both sides of the die pad 314 to etch away the entire thickness of die pad 314 through the slit openings of the etching mask 322, thereby forming reverse T-shaped opening 340 and pad segment 314 a. At this stage, the aforesaid provisional supporting bars still connect between the pad segment 314 a and die pad 314 to prevent the pad segment 314 a from falling off from the die pad 314. This first etching process may be accomplished in a leadframe manufacturing company. The leadframe 300 is then shipped to an assembly house.

As shown in FIG. 16, in an assembly house, a semiconductor die 312 is attached onto the die pad 314. Bond wires 318 and 336 are provided to form electrically connection between the bond pads 313 and the leads 316 and between the bond pads 313 on the semiconductor die 312 and the pad segment 314 a.

As shown in FIG. 17, after wire bonding, the entire assembly as depicted in FIG. 16 is then molded using a thermosetting compound 320. This compound may be a low-temperature hardening resin. Subsequently, the molded package may be subjected to a curing process. As specifically indicated, the bottom side or PCB side of the molded package is exposed.

According to another preferred embodiment of the present invention, the leadframe package is an MCM (multi-chip module) or SiP (System-in-Package) containing multiple semiconductor dies and passive components in a single package. FIG. 18 illustrates a top view of such a SiP leadframe package. As shown in FIG. 18, the SiP leadframe package 400 comprises a first semiconductor die 412 that is mounted on a primary die pad 414. The primary die pad 414 has four slender supporting bars 415 extending outward from four corners of the primary die pad 414. A bottom side of the primary die pad 414 is exposed in the package body to dissipate heat generated by the semiconductor die 412. The exposed bottom side of the primary die pad 414 may be electrically connected to a ground layer of the PCB.

The first semiconductor die 412 has thereon a plurality of bond pads 413 which are electrically connected to respective leads 416 through the bond wires 418. The SiP leadframe package 400 further comprises a secondary die pad 514. A second semiconductor die 512 is mounted on the secondary die pad 514. The secondary die pad 514 is partitioned off from the primary die pad 414 and does not directly contact with the primary die pad 414. Some of bond pads 513 on the die 512 are electrically connected to respective leads 416 through the bond wires 518. According to this invention, the first semiconductor die 412 is a digital chip and the second semiconductor die 512 is an analog chip.

Likewise, a bottom side of the secondary die pad 514 is exposed in the package body to dissipate heat generated by the semiconductor die 512. The exposed bottom side of the secondary die pad 514 may be electrically connected to a ground layer such as analog ground of the PCB, which can prevent digital circuit noise from affecting the analog signal path. In addition, separate pad segments 614 both having the same pad structure 14 b as set forth through FIG. 3 to FIG. 6 are provided on the primary die pad 414.

The function of the separate pad segments 614 is providing high-speed differential signals to the semiconductor die 512 such that a shorter electrical path can be established and less signal loss can be achieved. The separate pad segments 614 are isolated from the primary die pad 414 and do not need any structural support from the primary die pad 414 or from the leads 416.

Optionally, a passive component 560 is mounted on the primary die pad 414 and the secondary die pad 514 across a slit 540 between the primary die pad 414 and the secondary die pad 514. Some of the bond pads 413 are wire bonded to respective bond pads 513 on the semiconductor die 512 through bond wires 618. Some of the bond pads 513 on the second semiconductor die 512 are wire bonded to the separate pad segments 614 through bond wires 718. The entire assembly is encapsulated or molded by a molding compound 420.

FIGS. 19 and 20 demonstrate a flip-chip leadframe package 900 in accordance with still another preferred embodiment of this invention, wherein FIG. 19 is a planar view of the flip-chip leadframe package 900 and FIG. 20 is a cross-sectional view of the flip-chip leadframe package 900. As shown in FIGS. 19 and 20, the flip-chip leadframe package 900 comprises a die pad 914 with four slender supporting bars 915 extending outward from four corners of the primary die pad 914. A bottom side of the die pad 914 is exposed in the package body. The exposed bottom side of the die pad 914 is electrically connected to a digital ground (DGND) layer of the PCB, for example. Bumps or solder balls 924 are provided on the other side, i.e., the die side, which is opposite to the exposed side of the die pad 914 for the electrical bonding between the primary die pad and a flip chip 912 mounted on the die side.

The flip-chip leadframe package 900 further comprises a plurality of suspended pad segments 914 a˜914 d, each of which connects to a specific signal. For example, the suspended pad segment 914 a is connected to a V_(DD1) power signal, the suspended pad segment 914 b is connected to a V_(DD2) power signal, suspended pad segment 914 c is connected to a V_(DD3) power signal, and the suspended pad segment 914 d is connected to a analog ground (AGND) signal. Bumps 924 a˜924 d are disposed on respective suspended pad segments 914 a˜914 d for the electrical bonding between the suspended pad segments and a flip chip 912.

The suspended pad segments 914 a˜914 d are partitioned off from the die pad 914 and do not directly contact with the die pad 914, as previously mentioned. Further, the suspended pad segments 914 a˜914 d are isolated from any of the plurality of leads 916. The slits 940 a˜940 d may have a reverse T-shaped cross section as set forth in FIG. 4. A bottom side of each of the suspended pad segments 914 a˜914 d is exposed.

Leads 916 are disposed along four sides of the die pad 914. Bumps 916 a are disposed on respective leads 916 for the electrical bonding between the leads 916 and the flip chip 912. Except the bottom surfaces thereof, the flip chip 912, the die pad 914, the suspended pad segments 914 a˜914 d and the leads 916 are encapsulated in a molding compound 920. The molding compound 920 fills the slits 940 a˜940 d thereby holding the suspended pad segments 914 a˜914 d firmly in place.

Please refer to FIG. 21 to FIG. 25. FIG. 21 is a schematic, cross-sectional diagram showing a leadframe package according to this invention. FIG. 22 illustrates an exemplary layout of the leadframe according to this invention. FIGS. 23-25 are enlarged top views showing portions of the leadframe of FIG. 22. As shown in FIG. 21, the leadframe package 200 may be a Low-profile Quad Flat Pack (LQFP) exposed pad package comprising a unitary die pad 214, a semiconductor die 212 attached to the die pad 214, a plurality of leads 216 disposed along four peripheral edges of the die pad 214, a plurality of exposed pad segments 224 disposed between the plurality of leads 216 and the die pad 214, a plurality of conductive wires 218 electrically connected to and extending between the semiconductor die 212 and respective ones of the leads 216, a plurality of conductive wires 228 electrically connected to and extending between the semiconductor die 212 and the plurality of exposed pad segments 224, and a molding compound 220 at least partially encapsulating the die pad 214, the leads 216, the exposed pad segments 224 and the conductive wires 218 and 228. The bottom surfaces of the die pad 214 and the exposed pad segments 224 are exposed within the molding compound 220. The exposed pad segments 224 may extend along one of the four peripheral edges of the die pad 214 and the inner leads 216. The span of the exposed pad segment 224 depends upon electrical characteristics of bond pads 213 on the semiconductor die 212. For example, two or three signal pads such as digital power pads on the semiconductor die 212 may be wire bonded to a single exposed pad segment such as M2 for receiving digital power.

As shown in FIG. 22, in accordance with this invention, the exemplary leadframe 210 comprises a unitary die pad M1 disposed within a central opening of the leadframe 210. The die pad M1, which is supported within the central opening by four supporting bars 215, has a square configuration defining four peripheral edges of substantially equal length. A plurality of pad segments M2˜M53 extending between the inner leads 216 and the four peripheral edges of the die pad M1. The pad segments M2˜M53 may be supported by connecting bars such as C2˜C6 that connects the pad segments M2˜M6 with the die pad M1. Alternately, the pad segments may be supported by the dam bar 230 as set forth in FIG. 27. The connecting bars may be cut in a later assembly or package stage by laser, sawing, etching, carving or dejunk/trimming methods to electrically isolate the pad segments from each other.

As shown in FIG. 23, the pad segment M2, which is very like a reclaimed land, occupies a large open area between the leads 216 and the one of the four peripheral edges of the die pad M1. The pad segment M2 has one edge 233 that conforms to the shape defined by the inner ends of the leads 216. It is one feature of this invention that the pad segment M2 embraces at least one small-area pad segment, e.g., M3 and M4. The pad segment M2 is larger than the embraced pad segment M3 or M4. According to this invention, the pad segment M2 is electrically connected to a first signal and the embraced pad segment is electrically connected to a second signal, wherein the second signal is more sensitive to noise than the first signal. According to this invention, the first signal has a lower state switch rate than the second signal. For example, the first signal may be Double Data Rate (DDR) digital power, while the second signal may be DDR referenced power (V_(REF)), or analog power. In another case, the second signal may be control signals or differential signals. The pad segment M2 may have a zigzag side edge 235 that conjugates with a corresponding zigzag edge of a neighboring pad segment, e.g., M15 and M16.

As shown in FIG. 24, the pad segments M11 and M13 together embrace the sensitive pad segment M7. By virtue of such configuration, the power or ground pad segments M11 and M13 shelters the sensitive pad segment M7 such as analog power or analog ground signal from noise signals. Likewise, in FIG. 24, the protected sensitive pad segments include M14, M19 and M22. FIG. 25 shows that multiple strips of pad segments M 51˜M53 are disposed between the leads and the die pad M1. The protected sensitive pad segments include M43˜M47 and M49, wherein the sensitive pad segments M43˜M47 are protected by M10 and M12, and the sensitive pad segments M49 are protected by M48 and M50. FIG. 26 illustrates the bond pads 213, the pad segments M30˜M32 and the conductive wires 228. In an embodiment of the invention, the exposed pad segments 224 have a large surface area that is adequate for wire bonding more than four conductive wires 228, and the power/ground inductance and thermal resistance are reduced.

Those skilled in the art will readily observe that numerous modifications and alterations of the device and method may be made while retaining the teachings of the invention. Accordingly, the above disclosure should be construed as limited only by the metes and bounds of the appended claims. 

1. A leadframe package comprising: a die pad; a semiconductor die attached to the die pad; a plurality of leads disposed along four peripheral edges of the die pad; a first exposed pad segment disposed between the plurality of leads and the die pad; a second exposed pad segment being spaced apart from the first exposed pad segment and being disposed between the first exposed pad segment and the die pad, wherein both of the first and second exposed pads are covered with an etching mask; conductive wires electrically connected to and extending between the semiconductor die and respective ones of the leads, the first exposed pad segment and the second exposed pad segment; and a molding compound at least partially encapsulating the die pad, the leads, the first exposed pad segment, the second exposed pad segment and the conductive wires, wherein bottom surfaces of the die pad, the first exposed pad segment and the second exposed pad segment are exposed.
 2. The leadframe package according to claim 1, wherein the first exposed pad segment embraces and shelters the second exposed pad segment.
 3. The leadframe package according to claim 2, wherein the first exposed pad segment is electrically connected to a first signal and the second exposed pad segment is electrically connected to a second signal, wherein the second signal is more sensitive to noise than the first signal.
 4. The leadframe package according to claim 3, wherein the first signal has a lower state switch rate than the second signal.
 5. The leadframe package according to claim 3, wherein the second signal is one of analog power and analog ground.
 6. The leadframe package according to claim 3, wherein the second signal is one of control signals or differential signals.
 7. The leadframe package according to claim 1, wherein a surface area of the first exposed pad segment is larger than that of the second exposed pad segment.
 8. The leadframe package according to claim 1, wherein the first exposed pad segment extends along one of the four peripheral edges of the die pad and span of the first exposed pad segment depends upon electrical characteristics of bond pads on the semiconductor die.
 9. The leadframe package according to claim 1, wherein the first and second exposed pad segments have a surface area that is adequate for wire bonding more than four said conductive wires.
 10. A leadframe comprising: a die pad for mounting a semiconductor die thereon; a plurality of leads disposed along four peripheral edges of the die pad; a first pad segment disposed between the plurality of leads and the die pad, wherein the first pad segment juts out from one of the four peripheral edges of the die pad; and a second pad segment being spaced apart from the first exposed pad segment and being disposed between the first exposed pad segment and the die pad.
 11. The leadframe according to claim 10, wherein the four peripheral edges are straight edges and no recess is formed on any one of the four peripheral edges.
 12. The leadframe according to claim 10, wherein the first pad segment is used to couple to a first signal and the second pad segment is used to couple to a second signal, wherein the second signal is more sensitive to noise than the first signal.
 13. The leadframe according to claim 12, wherein the first signal has a lower state switch rate than the second signal.
 14. The leadframe according to claim 12, wherein the second signal is one of analog power and analog ground.
 15. The leadframe according to claim 12, wherein the second signal is one of control signals and differential signals.
 16. The leadframe according to claim 10, wherein a surface area of the first pad segment is larger than that of the second pad segment.
 17. The leadframe according to claim 10, wherein the first pad segment extends along said one of the four peripheral edges of the die pad and span of the first pad segment depends upon electrical characteristics of bond pads on the semiconductor die.
 18. The leadframe according to claim 10, wherein the first and second pad segments have a surface area that is adequate for wire bonding more than four conductive wires.
 19. The leadframe according to claim 10, wherein the first pad segment embraces and shelters the second pad segment. 